LUMOS II - FT-IR Microscope

Using FPA detector technology, the LUMOS II records a complete infrared spectrum at every pixel, allowing rapid generation of high-contrast chemical distribution maps. This capability is ideal for tablets, multilayer materials, polymers, coatings, and micro-contaminants.

The system reveals chemical and structural information at the micron scale, combining fine spatial resolution with a generous field of view for efficient sample analysis.

Automated workflows and intelligent positioning simplify operation, allowing reliable results without extensive user training while still offering full control for advanced users.

The TE-MCT detector provides excellent sensitivity without the need for liquid nitrogen or purge gas, reducing operating costs and complexity.

The LUMOS II – FT-IR Microscope was developed to remove complexity from advanced infrared microscopy. By integrating automation, intelligent software, and robust hardware, the system allows users of all experience levels to achieve reliable, high-quality results with confidence.

Complex analytical techniques no longer require complex operations. The LUMOS II delivers professional-grade FT-IR microscopy in a format that is intuitive, efficient, and dependable.

From its initial design, the LUMOS II balances ease of use with analytical power:

• New users benefit from guided workflows and automated settings that deliver results quickly

• Experienced analysts retain full control over acquisition parameters and data evaluation.

This dual-level usability makes the LUMOS II suitable for shared laboratories, regulated environments, and research facilities alike.

The LUMOS II sets a benchmark in ATR-based FT-IR microscopy. Its high-precision, retractable ATR crystal—integrated directly into the objective lens—ensures measurements are performed exactly at the desired location without obstructing the optical view.

Piezo-controlled crystal positioning, combined with FPA imaging, delivers consistent, high-quality ATR data across transmission, reflection, and ATR modes. This makes the system particularly valuable for failure analysis, product development, and micro-scale material investigations.

At the core of the LUMOS II is Bruker’s RockSolid™ interferometer, engineered for exceptional mechanical stability and consistent performance. Intelligent software continuously monitors system health, ensuring reliable results across extended operation periods.

The result is dependable FT-IR microscopy with minimal intervention and maximum confidence.

• Software-guided measurement workflows 
• High-definition spectral and visual data quality 
• No liquid nitrogen requirement 

• Sub-micrometer visual resolution

• Ultrafast FPA-based imaging

• ATR, transmission, and reflection compatibility

• Ergonomic design for efficient sample handling

• Compliance with cGMP and FDA 21 CFR Part 11

• Integrated OQ/PQ and pharmacopoeia validation routines

• Upgrade-ready architecture for future expansion

In India, the LUMOS II – FT-IR Microscope is supported by Inkarp, a well-established distributor and service provider with a strong nationwide presence. With decades of experience serving the Indian scientific community, Inkarp ensures reliable access to advanced FT-IR microscopy solutions along with responsive technical support.

From installation and training to preventive maintenance and troubleshooting, Inkarp’s expert team ensures optimal system performance—allowing laboratories to focus on their analytical objectives without disruption.