VERTEX 80/80v FT-IR Research Spectrometers

The VERTEX 80 series delivers precision that meets the highest research standards. In standard operation, apodized resolution better than 0.2 cm⁻¹ supports most room-temperature and ambient-pressure experiments.
For applications requiring extreme detail—such as low-pressure gas analysis or cryogenic semiconductor studies—the system achieves PEAK resolution better than 0.06 cm⁻¹, the highest available in a commercial benchtop FT-IR spectrometer.
In the visible range, resolving power exceeds 300,000:1, allowing researchers to capture extremely fine spectral features with confidence.

The vacuum-based optical design of the VERTEX 80v enables highly sensitive measurements across the mid-, near-, and far-infrared regions, free from water vapour absorption. This makes it possible to detect extremely weak signals, including surface coverages down to 10⁻³ monolayers.

The instrument offers extensive connectivity with:

• Five beam exit ports (left, right, and front) 
• Two beam input ports (rear and right) 

This allows simultaneous integration of multiple accessories, including:

• Synchrotron radiation sources 
• PMA 50 for polarization modulation spectroscopy 
• HYPERION FT-IR microscopes 
• Fibre-optic probes 
• Cryogenic and bolometer detectors 

Such flexibility makes the VERTEX 80 / 80v a powerful foundation for advanced, multi-technique research setups.

As Bruker’s flagship FT-IR research platform, the VERTEX 80/80v incorporates leading optical innovations, including:

• UltraScan™ interferometer for superior spectral and temporal accuracy

• PEAK performance optimisation for both vacuum and purge configurations

• Spectral coverage from 50,000 cm⁻¹ (UV/VIS) down to 5 cm⁻¹ (FIR/THz)

• Automated beamsplitter handling via BMS-c technology

Whether performing step-scan, rapid-scan, or time-resolved spectroscopy, the system delivers dependable results with future-ready expandability.